Characterizations of locally testable linear- and affine-invariant families期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Characterizations of locally testable linear- and affine-invariant families

Authors:	Angsheng Li

Affiliation:	^a State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, China ^b Graduate University of Chinese Academy of Sciences, China

Abstract:

Keywords:	Error correcting codes Locally testable codes (Algebraic) property tests
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