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Fabrication, microstructure, and mechanical properties of tin nanostructures
Authors:Michael J. Burek  Arief Suriadi BudimanZeinab Jahed  Nobumichi TamuraMartin Kunz  Sumin JinSeung Min J. Han  Gyuhyon LeeColin Zamecnik  Ting Y. Tsui
Affiliation:a Waterloo Institute for Nanotechnology, University of Waterloo, 200 University Ave. W., Waterloo, ON N2L 3G1, Canada
b Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, NM 87545, USA
c Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720, USA
d Graduate School of Energy Environment Water Sustainability, Korea Advanced Institute of Science and Technology, 373-1 Guseong Dong, Yuseong Gu, Daejeon 305-701, Republic of Korea
Abstract:Vertically aligned, cylindrical tin nanopillars have been fabricated via an electron beam lithography and electroplating method. Characterization by a non-destructive synchrotron X-ray microdiffraction (μSXRD) technique revealed that the tin nanostructures are body-centered tetragonal and are likely single-crystalline, or consist of a few large grains. The mechanical properties of tin nanopillars with average diameters of 920 nm, 560 nm, and 350 nm were studied by uniaxial compression in a nanoindenter outfitted with a flat punch diamond tip. The results of compression tests reveal strain rate sensitivity for nanoscale tin deformation, which matches closely to the previously reported bulk tin values. However, unlike bulk, tin nanopillars exhibit size-dependent flow stresses where smaller diameter specimens exhibit greater attained strengths. The observed size-dependence matches closely to that previously reported for single-crystalline face centered cubic metals at the nanoscale. μSXRD data was used to compare the dislocation density between as-fabricated and deformed tin nanopillars. Results of this comparison suggest that there is no measurable accumulation of dislocations within deformed tin nanopillars.
Keywords:Nanoindentation   Plastic deformation   Nanostructure   Yield phenomenon   Size effects
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