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Development of Reference Shunt for Short‐Time Alternating High Current Tests and Study of Measuring System
Authors:JUNZO KIDA  MASATOSHI NAKAJIMA  YUTAKA GODA  KUNIO KIKUCHI  KIETSU KUDO  HIROMI ISHII  YOSHIHIKO MATSUI  TOSHIRO MATSUMURA  TATSUO KAWAMURA
Affiliation:1. Hitachi Ltd., Japan;2. Fuji Electric Co., Ltd., Japan;3. Central Research Institute of Electric Power Industry, Japan;4. Mitsubishi Electric Co., Ltd., Japan;5. Toshiba Corporation, Japan;6. Nisshin Electric Co., Ltd., Japan;7. Meidensha Corp., Japan;8. Nagoya University, Japan;9. University of Tokyo, Japan
Abstract:Short‐circuit tests for power circuit breakers and others require alternative short‐time current measurement, from a few kA to over several tens kA. However, the reference measurement system as a national standard or a specified secondary standard instrument to directly perform comparative test as a complete calibration test in high current class has not yet been established globally. The Japan Short‐Circuit Testing Committee (hereinafter referred to as “JSTC”) has therefore developed a shunt resistor that can be used as a standard instrument for high current measurement. Reference system using this shunt resistor is also considered by JSTC. The performance of the newly developed shunt resistor has been checked through several methods, such as resistance measurement, high power current test, high frequency current test, temperature rise test, and interference test. The results of the tests proved satisfactory performance. Resistance of the shunt resistor before and after the tests was invariant and stable. This makes the shunt resistor adequate for a reference in practical use. In addition, evaluation of uncertainty of the whole reference system including this shunt resistor satisfactorily fulfills the requirements of IEC 62475 edition 1.0, 2010.
Keywords:short‐time alternating current  shunt  comparison measurement  uncertainty  reference measuring system  traceability
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