| Abstract: | This paper presents an easy-to-design interface circuit to measure very small-percentage capacitance variations in capacitive sensors, especially suitable for industrial measurements. A computer-controlled 24-bit A/D converter is employed to obtain a higher resolution. This interface circuit can be used with various types of capacitive sensors. The most interesting thing is, that the measurement results through this interface circuit are independent of the initial capacitance of the sensor. In addition, the double differential operating principle used here minimizes the error caused by coupling and stray capacitance of sensor probes. The operating principle of the designed interface circuit, the major assumptions made, test data, and possible future developments are discussed |
