A nondestructive method for measuring thermal parameters of hermetically sealed electron devices |
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| Authors: | T D Alieva N M Akhundova D Sh Abdinov |
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| Affiliation: | (1) Institute of Photoelectronics, Academy of Sciences of Azerbaijan, ul. Agaeva 555, 370141 Baku, Azerbaijan |
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| Abstract: | The nonrestrictive method described is intended for measuring the quantity of heat coming from the surroundings into the working
volume of the hermetically sealed device with a thermoelectric cooler. The method is based on the dependence of the thermal
emf that appears across the thermopile leads of the thermoelectric cooler in the stationary operation mode on the thermal
load on the heat-absorbing surface. |
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| Keywords: | |
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