(1) Department of Electrical and Electronic Engineering, University of Cagliari, Piazza dArmi, 09123 Cagliari, Italy;(2) Department of Electronics and Telecommunications, University of Florence, Via S. Marta, 3, 50139 Firenze, Italy
Abstract:
A fault diagnosis procedure for analog linear circuits is presented. It uses an off-line trained neural network as a classifier. The innovative aspect of the proposed approach is the way the information provided by testability and ambiguity group determination is exploited when choosing the neural network architecture. The effectiveness of the proposed approach is shown by comparing with similar work that has already appeared in the literature.