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Experimental study on heavy ion single-event effects in flash-based FPGAs |
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| Affiliation: | 1. Institute of Modem Physics, Chinese Academy of Sciences,Lanzhou 730000, China;University of Chinese Academy of Sciences, Beijing 100049,China;2. Institute of Modem Physics, Chinese Academy of Sciences,Lanzhou 730000, China |
| Abstract: | |
| Keywords: | Single-event effects (SEEs) Flash-based FPGAs HIRFL Heavy ion experiments |
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