Reliability analysis for electronic devices using beta‐Weibull distribution |
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Authors: | Luis Carlos Méndez‐González Luis Alberto Rodríguez‐Picón Delia Julieta Valles‐Rosales Roberto Romero‐López Abel Eduardo Quezada‐Carreón |
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Affiliation: | 1. Department of Industrial Engineering and Manufacturing, Institute of Engineering and Technology, Universidad Autónoma de Ciudad Juárez, Ciudad Juárez, México;2. Department of Industrial Engineering, Institute of Engineering and Technology, New Mexico State University, USA;3. Department of Electrical and Computer Science, Institute of Engineering and Technology, Universidad Autónoma de Ciudad Juárez, Ciudad Juárez, México |
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Abstract: | Today, in reliability analysis, the most used distribution to describe the behavior of electronic products under voltage profiles is the Weibull distribution. Nevertheless, the Weibull distribution does not provide a good fit to lifetime datasets that exhibit bathtub‐shaped or upside‐down bathtub–shaped (unimodal) failure rates, which are often encountered in the reliability analysis of electronic devices. In this paper, a reliability model based on the beta‐Weibull distribution and the inverse power law is proposed. This new model provides a better approach to model the performance and fit of the lifetimes of electronic devices. To estimate the parameters of the proposed model, a Bayesian analysis is used. A case study based on the lifetime of a surface mounted electrolytic capacitor is presented, the results showed that the estimation of the proposed model differs from the inverse power law–Weibull and that it affects directly the mean time to failure, the failure rate, the behavior, and the performance of the capacitor under analysis. |
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Keywords: | Bayesian estimation beta‐Weibull distribution inverse power law reliability Weibull distribution |
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