| 光学材料和光学薄膜的光热表征(英文) |
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| 引用本文： | 沈俊. 光学材料和光学薄膜的光热表征(英文)[J]. 光电工程, 2002, 0(Z1) |
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| 作者姓名： | 沈俊 |
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| 作者单位： | 加拿大国家研究委员会创新中心 加拿大温哥华V6TIW5 |
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| 摘 要： | 光热技术用来测量样品的光学和热特性。简要介绍了光热技术及其在光学薄膜测量和钛蓝宝石激光晶体表征中的应用。光热技术可以提供纯光学光谱学所无法提供的、类似光-热能量转换效率之类的信息。光热技术已被用作质量测试和改善现代光学制造的有用工具。
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| 关 键 词： | 光学薄膜 光学材料 光热特性 |
Photothermal characterisation of optical materials and optical thin films |
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| SHEN Jun. Photothermal characterisation of optical materials and optical thin films[J]. Opto-Electronic Engineering, 2002, 0(Z1) |
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| Authors: | SHEN Jun |
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| Abstract: | Photothermal techniques have been employed to measure optical and thermal properties of samples. This paper briefly introduces photothermal techniques and their applications in optical thin film coating measurements and Ti:sapphire laser crystal characterisation. Photothermal techniques can provide the information that pure optical spectroscopy is not able to give, such as optical-to-thermal energy conversion efficiency. Photothermal techniques have been proved as useful tools for quality test and improvement in modern optical manufacturing. |
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| Keywords: | Optical thin films Optical materials Photothermal characterisation In |
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