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Homogeneity study of an Fe impurity in unalloyed Zn using PIXE
Authors:Faziah Gamaz, Carlos Chaves,Uwe W  tjen
Affiliation:

European Commission, Joint Research Centre, Institute for Reference Materials and Measurements (IRMM), Retieseweg, B-2440, Geel, Belgium

Abstract:We have studied the distribution of an Fe impurity in unalloyed Zn material along line scans in spots of 1 mm diameter each using PIXE. In order to achieve the necessary precision (1%) in the determination of this low Fe content (about 100 mg/kg), a sufficient counting rate of Fe X-rays is needed without overloading the counting electronics with Zn X-rays at the same time. Therefore, the development of our PIXE analysis system had to take into account: (a) optimising the thickness of a Ni absorber foil in order to selectively reduce the counting rate of Zn without adding an unproportionally high Ni counting rate, (b) implementing a triggered ion beam deflection system capable of handling very high counting rates (up to 8 kcps), (c) developing the spectrum evaluation code to take account of the selective absorption by the Ni foil. The results of our PIXE measurements showed an inhomogeneity in Fe of up to 10%, considered too high to accept this zinc material as a new reference material.
Keywords:PIXE   Materials analysis   High precision impurity determination   Triggered ion Beam deflection
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