Characterization of Tin disulphide thin films prepared at different substrate temperature using spray pyrolysis technique |
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Authors: | K Vijayakumar C Sanjeeviraja M Jayachandran L Amalraj |
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Affiliation: | (1) Department of Physics, K.L.N. College of Information Technology, Madurai, 630 611, India;(2) Department of Physics, Alagappa University, Karaikudi, 630 003, India;(3) ECMS Division, Central Electrochemical Research Institute, Karaikudi, 630 006, India;(4) Department of Physics, V.H.N.S.N. College, Virudhunagar, 626 001, India; |
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Abstract: | Thin films of tin disulphide on glass substrates were prepared by spray pyrolysis technique using precursor solutions of SnCl2·2H2O and n–n dimethyl thiourea at different substrate temperatures varied in the range 348–423 K. Using the hot probe technique
the type of conductivity is found to be n type. X ray diffraction analysis revealed the polycrystalline nature with increasing
crystallinity with respect to substrate temperature. The preferential orientation growth of SnS2 compound having hexagonal structure along (002) plane increased with the substrate temperature. The size of the tin disulphide
crystallites with nano dimension were determined using the Full Width Half Maximum values of the Bragg peaks and found to
increase with the substrate temperature. The surface morphology had been observed on the surface of these films using scanning
electron microscope. The optical absorption and transmittance spectra have been recorded for these films in the wavelength
range 400–800 nm. Thickness of these films was found using surface roughness profilometer. The absorption coefficient (α) was determined for all the films. Direct band gap values were found to exist in all the films deposited at different substrate
temperatures. The value of room temperature resistivity in dark decreased from 5.95 × 103 Ω cm for the amorphous film deposited at low temperature (348 K) to 2.22 × 103 Ω cm for the polycrystalline film deposited at high temperature (423 K) whereas the resistivity values in light decreased
from 1.48 × 103 to 0.55 × 103 Ω cm respectively, which is determined using the four probe method. Activation energy of these thin films was determined
by Arrhenius plot. |
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