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一种新型D-RESURF埋栅SOI LDMOS
引用本文:廖红,张伟,罗小蓉,张波,李肇基,顾晶晶. 一种新型D-RESURF埋栅SOI LDMOS[J]. 微电子学, 2008, 38(6)
作者姓名:廖红  张伟  罗小蓉  张波  李肇基  顾晶晶
作者单位:电子科技大学,电子薄膜与集成器件国家重点实验室,成都,610054
基金项目:国家自然科学基金重点资助项目  
摘    要:提出了一种新型D-RESURF埋栅SOI LDMOS (EGDR-SOI LDMOS)结构,其栅电极位于P-body区的下面,可以在扩展的埋栅电极处形成多数载流子的积累层;同时,采用Double- RESURF技术,在漂移区中引入两区的P降场层,有效降低了器件的比导通电阻,并提高了器件的击穿电压.采用二维数值仿真软件MEDICI,对器件的扩展栅电极、降场层进行了优化设计.结果表明,相对于普通SOI LDMOS,该结构的比导通电阻下降了78%,击穿电压上升了22%.

关 键 词:功率器件  埋栅

A Novel D-RESURF SOI LDMOS with Embedded Gate
LIAO Hong,ZHANG Wei,LUO Xiao-rong,ZHANG Bo,LI Zhao-ji,GU Jing-jing. A Novel D-RESURF SOI LDMOS with Embedded Gate[J]. Microelectronics, 2008, 38(6)
Authors:LIAO Hong  ZHANG Wei  LUO Xiao-rong  ZHANG Bo  LI Zhao-ji  GU Jing-jing
Affiliation:LIAO Hong ZHANG Wei LUO Xiaorong ZHANG Bo LI Zhaoji GU Jingjing (State Key Lab of Elec.Thin Films , Integr.Dev.,Univ.of Elec.Sci., Technol.of China,Chengdu 610054,P.R.China)
Abstract:A novel D-RESURF SOI LDMOS structure with embedded gate(EGDR-SOI LDMOS)was proposed. The gate of the structure was located under P-body region,leading to majority carrier's accumulation on the side wall of the extended gate.A P-top layer with two zones was introduced into drift region,which reduced the specific on-resistance and increased the breakdown voltage effectively.The extended gate and P-top layer were optimized by using 2-D MEDICI.Results indicated that the specific on-resistance decreased by 78%an...
Keywords:Double RESURF  SOI  LDMOS
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