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Statistical collector implant optimization for BiCMOS using fast, predictive bipolar device simulation and response surface techniques |
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| Authors: | James R. Parker and David J. Roulston |
| Affiliation: | Department of Electrical and Computer Engineering University of Waterloo Waterloo, Ontario, Canada N2L 3G1 |
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| 本文献已被 ScienceDirect 等数据库收录！ | |