Electrodeposition of wide band gap InGaxSyOz thin films for solar cell applications |
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Authors: | AM Abdel Haleem M Ichimura |
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Affiliation: | aDepartment of Engineering Physics, Electronics and Mechanics, Nagoya Institute of Technology, Gokiso, Showa, Nagoya 466-8555, Japan |
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Abstract: | Indium-Gallium-sulfide-oxide thin films were deposited onto F-doped SnO2-coated glass by electrochemical deposition from an aqueous bath. The films were deposited at three different ratios of gallium to indium in the precursor bath; namely Ga/In] = 2/8, 5/5 and 8/2. The impact of the gallium content on the composition, optical transmission, structure, photosensitivity, electrical resistivity and morphology of the deposited films was investigated. The films deposited at Ga/In] = 5/5 and 8/2 had an energy gap as high as 3.5 eV. The X-ray diffraction spectrum of the film deposited at Ga/In] = 2/8 contained weak peaks of indium metal, but the In peaks were absent in the spectra of the films deposited at Ga/In] = 5/5 and 8/2. The photosensitivity of the film was observed by means of photoelectrochemical measurements, which confirmed that all the films showed n-type conduction. Finally, the film has been used as a buffer layer to fabricate a SnS-based thin film solar cell. |
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Keywords: | Indium Gallium sulfide oxide Thin films Electrochemical deposition Cd-free buffer layer Solar cells |
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