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Evolution of the Structural and Electrical Properties of GeTe Under Different Annealing Conditions |
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| Authors: | Ki-Hong Kim Yong-Koo Kyoung Jun-Ho Lee Yong-Nam Ham Sang-Jun Choi |
| Affiliation: | 1. AS Group, CAS Center, Corporate Technology Operations SAIT, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea 2. Device Architecture Lab, Semiconductor R&D Center, Samsung Electronics Co. Ltd., Yongin, 446-712, Republic of Korea |
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