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Erratum to “On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies” [MR 51/9-11 (2011) 1810-1818] |
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| Authors: | Usama Zaghloul George Papaioannou Fabio Coccetti Patrick Pons Robert Plana |
| Affiliation: | a CNRS, LAAS, 7 avenue du colonel Roche, F-31077 Toulouse, France b Université de Toulouse, UPS, INSA, INP, ISAE, LAAS, F-31077 Toulouse, France c NLBB Laboratory, The Ohio State University, Columbus, OH 43210, USA d University of Athens, Solid State Physics, Panepistimiopolis, Zografos, Athens, Greece e Novamems, 10 av. De l’ Europe, F-31520 Toulouse, France |
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