Measurement of the bending strength of vapor-liquid-solid grown silicon nanowires |
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Authors: | Hoffmann Samuel Utke Ivo Moser Benedikt Michler Johann Christiansen Silke H Schmidt Volker Senz Stephan Werner Peter Gösele Ulrich Ballif Christophe |
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Affiliation: | EMPA Materials Science and Technology, Feuerwerkerstrasse 39, 3602 Thun, Switzerland. samuel.hoffmann@empa.ch |
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Abstract: | The fracture strength of silicon nanowires grown on a 111] silicon substrate by the vapor-liquid-solid process was measured. The nanowires, with diameters between 100 and 200 nm and a typical length of 2 microm, were subjected to bending tests using an atomic force microscopy setup inside a scanning electron microscope. The average strength calculated from the maximum nanowire deflection before fracture was around 12 GPa, which is 6% of the Young's modulus of silicon along the nanowire direction. This value is close to the theoretical fracture strength, which indicates that surface or volume defects, if present, play only a minor role in fracture initiation. |
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