| Affiliation: | 1. Institute of Microelectronics, Department of Electrical Engineering, and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan;2. Department of Electronic Engineering, Kun-Shan University, Tainan 710, Taiwan;3. Graduate Institute of Materials Engineering, National Pingtung University of Science and Technology, Pingtung County 912, Taiwan;1. Institute of Microelectronics and Advanced Optoelectronic Technology Center, National Cheng Kung University, Tainan 701, Taiwan;2. Department of Applied Science, National Taitung University, Taitung 950, Taiwan;3. Institute of Electro-Optical and Materials Science, National Formosa University, Huwei, Yunlin 632, Taiwan;4. Department of Electrical Engineering, Kun Shan University, Tainan 710, Taiwan;1. College of Mathematics and Physics, Jinggangshan University, Ji''an 343009, PR China;2. School of Materials Science and Engineering, Jiangxi, University of Science and Technology, Ganzhou, 341000, PR China;3. Electronic Functional Materials Laboratory, Huizhou University, Huizhou Guangdong, PR China;1. Belgian Nuclear Research Centre (SCK-CEN), Boeretang 200, 2400, Mol, Belgium;2. Radiation Measurement Research Team, National Institute of Radiological Sciences (NIRS/QST), Japan;3. Institute of Nuclear Physics Polish Academy of Sciences, PL-31342, Krakow, Poland |
