TFT-LCD微米级显示缺陷的自动检测算法

针对现有薄膜晶体管液晶显示器(TFT-LCD)缺陷检测算法只能检测肉眼可见的缺陷,不能检测肉眼不可见的微米级缺陷的问题,首先提出一种基于局部图像模板匹配的图像配准方法,以实现亚像素级上的图像配准,提出基于差影法和亚像素级图像配准的TFT-LCD微米级缺陷自动检测算法,实现TFT-LCD微米级缺陷的快速自动检测.将该方法应用于实际TFT-LCD玻璃基板的缺陷检测上,检测结果表明,Array区电路的漏检率和错检率低于3%,Pad区电路的漏检率和错检率低于5%,能满足实际检测的要求.

An automatic detection algorithm for TFT-LCD micro display defects

Aiming at the limitation of most TFT-LCD(Thin Film Transistor-Liquid Crystal Display) defect detection methods for micro defects,we propose an image registration method based on local template matching for implementing image registration in subpixel level.Then we propose a TFT-LCD micro defect detection algorithm based on the image substraction method and the subpixel image registration.With this method,we can detect TFT-LCD micro defects automatically.Applicatin of this method to TFT-LCD array area detection and peripheral area detection shows that the rates of both miss and false detection are lower than 3% in array area,and are lower than 5% in peripheral area.Which can meet the detection requirement.