1 NTT Basic Research Laboratories, 3-1 Morinosato-Wakamiya, Atsugi-shi, Kanagawa 243-01, Japan
2 School of Science and Engineering, Waseda University, 3-4-1 Ohkubo, Shinjuku-ku, Tokyo 169, Japan
Abstract:
Using elementary Se we grew Se-doped GaAs films on GaAs (111), (411), (711) and (100) substrates by molecular beam epitaxy. The films grown on all the high-index substrates showed n-type conduction and the maximum carrier concentration reached 2.1 × 1019 cm?3 for the film grown on the (411)B substrate. The carrier concentration began to saturate at a Se concentration near 1019 cm?3 but continued to increase up to a Se concentration of 2 × 1020 cm?3. Above 2 × 1020 cm?3 Se concentration, slow reduction of the carrier concentration was observed. We obtained excellent surface morphology when n-type GaAs films were grown on (411)A and (711)B substrates even at a Se concentration of 7 × 1020 cm?3.