| 基于优化权集的数字集成电路随机测试 |
| |
| 引用本文： | 谢永乐,陈光(礻禹). 基于优化权集的数字集成电路随机测试[J]. 四川大学学报(工程科学版), 2002, 34(4): 104-107 |
| |
| 作者姓名： | 谢永乐 陈光(礻禹) |
| |
| 作者单位： | 1. 四川大学,制造科学与工程学院,四川,成都,610065;电子科技大学,CAT研究室,四川,成都,610054
2. 电子科技大学,CAT研究室,四川,成都,610054 |
| |
| 摘 要： | 提出了一种基于确定性测试集的数字集成电路随机测试生成方法。通过将完备测试集分成若干子集，由每一子集计算产生子集中测试矢量的被测电路各主输入端取“1”值的概率组合即所谓的权集。通过减小测试子集生成概率的方差可以减少低生成概率的测试矢量数，进而减小在高故障覆盖率下的测试长度，该方法对大规模集成电路的内测试和外测试皆适用。
|
| 关 键 词： | 自动测试生成器 多权集 生成概率 故障诊断 优化权集 数字集成电路 随机测试 |
| 文章编号： | 1009-3087(2002)04-0104-04 |
| 修稿时间： | 2001-10-16 |
Optimized Weight Set Based on Random Test of Digital Integrated Circuits |
| |
| XIE Yong-le ,,CHEN Guang-ju. Optimized Weight Set Based on Random Test of Digital Integrated Circuits[J]. Journal of Sichuan University (Engineering Science Edition), 2002, 34(4): 104-107 |
| |
| Authors: | XIE Yong-le CHEN Guang-ju |
| |
| Affiliation: | XIE Yong-le 1,2,CHEN Guang-ju 2 |
| |
| Abstract: | Based on a deterministic test set produced by an automatic test pattern generation tools,a new methodology is presented for the generation of multiple weight set for random test of digital integrated circuits. The method in this paper derives from the division of complete test set into several subsets and each subset corresponds to a weight set. A certain weight set comprises of the probabilities of producing a logic one to each primitive input. By reducing the variance of generation probability to each deterministic test pattern,the test length to achieve a high fault coverage can be decreased. The method can be used both for BIST and external testing of VLSI. |
| |
| Keywords: | weighted random test auto-test pattern generator multiple weight set generation probability fault diagnosis of digital system |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
