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弯晶谱仪在X射线探测中的应用
引用本文:施军,肖沙里,王洪建,唐昶环,雷小明.弯晶谱仪在X射线探测中的应用[J].光电子.激光,2008,19(9).
作者姓名:施军  肖沙里  王洪建  唐昶环  雷小明
作者单位:重庆大学光电技术及系统教育部重点实验室,重庆,400030;中国工程物理研究院,四川绵阳,621900
摘    要:为了对激光等离子体进行诊断,研制了聚焦型椭圆弯晶谱仪用来探测等离子体辐射的X射线.谱仪利用从椭圆一个焦点发射出的光线经椭圆面反射必汇聚于另一焦点的性质而研制,椭圆的离心率和焦距分别为0.9586mm及1350mm.在此采用氟化锂(200)(2d=0.4027nm)作为晶体分析器,其布拉格衍射角变化范围为30~67.5°,可探测波长范嗣为0.2~O.37nm.在"神光-Ⅱ"激光装置上进行了打靶实验,利用软X射线CCD相机作为摄谱器件,该谱仪获得了钛的类He共振线(w)、磁四级M2跃迁x线、互组合跃迁y线、禁戒谱线(z)以及类Li谱线(q).实验结果表明该谱仪的最高光谱分辨率(λ/△λ)可以达到1000以上,能够用于激光等离子体X射线光谱学研究.

关 键 词:激光等离子体  弯晶谱仪  X射线光谱  分辨率

Application of curved crystal spectrometer in measuring X-ray line
SHI Jun,XIAO Sha-li,Wang Hong-jian,Tang Chang-huan,Lei Xiao-ming.Application of curved crystal spectrometer in measuring X-ray line[J].Journal of Optoelectronics·laser,2008,19(9).
Authors:SHI Jun  XIAO Sha-li  Wang Hong-jian  Tang Chang-huan  Lei Xiao-ming
Affiliation:SHI Jun1,XIAO Sha-li1,Wang Hong-jian1,Tang Chang-huan2,Lei Xiao-ming1(1.The Key Laboratory of Optoelectronic Technology , System,Ministry of Education,Chongqing University,Chongqing 400030,China,2.Research Center of Laser Fusion,Chinese Academy of Engineering Physics,Mianyang 621900,China)
Abstract:A focusion curved crystal spectrometer has been developed to measure X-ray lines radiated from laser-produced plasmas.Which is based on the theory that the ray emitted from a focus of an ellipse will converge on the other focus by the reflection on the elliptical surface.The focal length and the eccentricity of the ellipse is 1 350 mm and 0.958 6,respectively.The spectrograph can be used to measure the X-ray lines in the wavelength range of 0.2-0.37 nm,and the LiF crystal(200)(2 d=0.402 7 nm)is used as disp...
Keywords:Llaser-produced plasma  curved crystal spectrometer  X-ray spectrum  wavelength resolution  
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