光伏组件PID失效与DH失效的微观分析研究

对电势诱导衰减(potential induced degradation,PID)测试和湿热(damp heat,DH)测试后失效的光伏组件进行破拆,根据电致发光(electroluminescence,EL)测试结果,选取EL图像显示的不同明、暗区域(正常区域、异常区域)的太阳电池作为测试样品,并对其表面进行扫描电...

RESEARCH ON MICRO ANALYSIS OF PID AND DH FAILED PV MODULES

The failed PV modules after potential induced degradation(PID)test and damp heat(DH)test were disassembled.According to the electroluminescence(EL)test results,the samples of solar cells in different bright and dark regions(normal region and abnormal region)of EL were selected,and the surface of solar cell was analyzed by scanning electron microscopy-energy disperse spectroscopy(SEM-EDS)tests.The results show that the failure mechanism of PV modules of PID test and DH test is related to the migration of metal ions in glass to solar cells in high temperature and humidity environment.High temperature and humidity environment will lead to the accumulation of Na~+and other metal ions in the glass to the surface of the solar cell,forming leakage current channel,the external electric field of PID test will accelerate the migration and enrichment of Na~+and other metal ions,the gate line is corroded,and the dense SiNx layer on the surface of the solar cell is destroyed,resulting in a failed PV module and dark EL image of solar cell.