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Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundary |
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| Authors: | Findlay S D Azuma S Shibata N Okunishi E Ikuhara Y |
| Affiliation: | a Institute of Engineering Innovation, The University of Tokyo, Tokyo 116-0013, Japan b PRESTO, Japan Science and Technology Agency, Saitama 332-0012, Japan c JEOL Ltd., Tokyo 196-8558, Japan d Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya 456-8587, Japan e WPI Advanced Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan |
| Abstract: | |
| Keywords: | Scanning transmission electron microscopy (STEM) High-angle annular dark field (HAADF) Annular bright field (ABF) |
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