用内建自测试(BIST)方法测试IP核

近几年基于预定制模块IP(Intellectua lProperty)核的SoC(片上系统)技术得到快速发展，各种功能的IP核可以集成在一块芯片上．从而使得SoC的测试、IP核的验证以及IP核相关性的测试变得非常困难，传统的测试和验证方法难以胜任。本文通过曼彻斯特编码译码器IP核的设计、测试，介绍了广泛应用于IP核测试的方法一内建自测试fBuilt—In SeIf Test)方法，强调了面向IP测试的IP核设计有关方法。

Built-In Self Test Technique For Testing IP Cores

System on chip (SoC) technology based on IP Cores (Intellectual Property Cores) has developed rapidly in recent years. And IP Cores are integrated on the single chip,therefor, it's very difficult to test SoC functions, IP cores functions and interaction between IP Cores. The tranditional testing and verifying methods can not be capable of doing all the above works.This paper introduces Built-In Self Test (BIST) method which can be widely used in IP Cores testing through describing the design and test of Manchester Encoder and Decoder IP Cores. The test-oriented techiques for testing the IP Cores are underlined also.