Singular Grain Boundaries in Alumina Doped with Silica |
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Authors: | Mi Jin Kim Seung Min Kim Duk Yong Yoon |
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Affiliation: | Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Taejon 305-701, Korea |
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Abstract: | Pure Al2O3 powder compact sintered at 1400°C after adding 100 mol ppm of SiO2 shows grain boundaries that are flat, even across the triple junctions. TEM observations show that these flat grain boundaries are parallel to the basal planes of the grains on one side. These flat grain boundaries must be singular. At such a low SiO2 concentration and a low temperature, it is very unlikely that any liquid phase is present at these grain boundaries to cause such flat boundary shapes. |
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Keywords: | alumina silica grain boundaries transmission electron microscopy |
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