Determination of the modulation frequency for thermographic non-destructive testing |
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| Affiliation: | 1. Instituto Nacional de Técnica Aeroespacial, INTA, 28850, Torrejón de Ardoz, Madrid, Spain;2. Department of Applied Physics (FARN), ETSI Minas, Universidad Politécnica de Madrid, 28003 Madrid, Spain;1. Department of Mechanics, Beijing Jiaotong University, Beijing 100044, China;2. Department of Civil and Environmental Engineering, Northwestern University, Evanston, IL 60208-3109, USA;1. Imperial College, Department of Mechanical Engineering, London, United Kingdom;2. BAM Federal Institute for Materials Research and Testing, Berlin, Germany;1. Department of Engineering, Polo Scientifico Didattico di Terni, University of Perugia, Strada di Pentima 4, 05100, Terni, Italy;2. Department of Industrial and Information Engineering and Economics, University of L''Aquila, Piazzale E. Pontieri 1, 67100, Loc. Monteluco di Roio, L''Aquila, AQ, Italy;3. School of Engineering, University of Warwick, Library Road, CV4 7AL, Coventry, United Kingdom;4. Department of Electrical and Computer Engineering, Laval University, 1065, av. de la Médecine, G1V 0A6, Québec City, QC, Canada;5. Department of Informatics, Modeling, Electronics and Systems Engineering, University of Calabria, Via Pietro Bucci, 87036, Arcavacata, Rende CS, Italy |
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| Abstract: | We propose polynomial solutions of the inverse heat conduction problem to design thermographic non-destructive tests for detecting defects in composite and multi-layer materials. Inverse heat conduction in a multi-layer material slab with periodic temperature excitation is considered, and analytical quadrupole representation is used to derive a lumped parameters formulation. Predictions of the proposed polynomial representations are experimentally validated by detecting machined defects on thermally excited panels. For modulation frequencies outside the predicted detection range, defects appear on thermal images as blurry and unstructured; conversely, for modulation frequencies within the predicted range, defects are correctly represented on thermal images. |
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| Keywords: | Inverse heat conduction Infrared thermography Excitation frequency Experimental validation |
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