Detection of zinc blende phase by the pulsed laser photoacoustic technique in ZnO thin films deposited via pulsed laser deposition |
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| Affiliation: | 1. Área de Ciencia de Materiales, Universidad Autónoma Metropolitana, Av. San Pablo No. 180, Col. Reynosa Tamaulipas, Delegación Azcapotzalco, C.P. 02220, Mexico;2. Centro de Ciencias Aplicadas y Desarrollo Tecnológico, Universidad Nacional Autónoma de México, Circuito Exterior S/N, Ciudad Universitaria, A.P. 70-186, C.P. 04510, México D.F., Mexico;1. Nizhny Novgorod State University, 23 Gagarin avenue, Nizhny Novgorod 603950, Russia;2. Nizhny Novgorod State University of Architecture and Civil Engineering, 65 Il׳insky street, Nizhny Novgorod 603950, Russia;3. Nizhny Novgorod Academy of the Ministry of Internal Affairs of Russia, 3 Ankudinovskoe Shosse, Nizhny Novgorod 603950, Russia;1. Department of Physics, University of Calicut, 673635, India;2. Kerala State Council for Science, Technology and Environment, Thiruvananthapuram, Kerala 695004, India;1. Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, VA, United States;2. CREOL, The College of Optics and Photonics, University of Central Florida, Orlando, FL, United States;3. Department of Physics, Virginia Commonwealth University, Richmond, VA, United States;1. Amity Institute of Nanotechnology, Amity University, U.P., Noida 201303, India;2. Academy of Scientific & Innovative Research (ACSIR), CSIR-National Physical Laboratory, Dr. K.S. Krishnan Road, New Delhi 110012, India;3. Advanced Material & Devices Division, CSIR- National Physical Laboratory, New Delhi 110012, India |
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| Abstract: | Pulsed laser deposition (PLD) was used to grow ZnO thin films on corning glass and silicon substrates at different oxygen pressures (1 y 10 mTorr). The structural analysis of the films was performed by X-ray diffraction and pulsed laser photoacoustic (PLPA) techniques. Both methods were employed to identify the minority zinc blende phase in the films. The relative difference between the structural changes detected in the films with the temperature increases was statistically analyzed. It was found that regardless of the substrate and the oxygen pressure used for the growth, the films exhibit a phase transition at 310 °C, which corresponds to the transformation of zinc blende structure to hexagonal wurtzite. The results demonstrate that the zinc blende phase in the films is present not only on cubic substrates but also on glass, and confirm that PLPA technique is a very sensitive method for the detection of minority phase changes. |
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| Keywords: | PLD Zinc blende PLPA technique X-ray diffraction Statistical analyses |
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