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PPM水平下元器件内在质量评价系统
引用本文:贾新章,刘宁,宋军建. PPM水平下元器件内在质量评价系统[J]. 电子产品可靠性与环境试验, 2001, 0(5): 2-7
作者姓名:贾新章  刘宁  宋军建
作者单位:西安电子科技大学微电子所,
摘    要:随着元器件质量和可靠性水平的迅速提高 ,国际上对待元器件内在质量的评价问题引入了新的思路[1],采用了三项主要技术(Cpk、SPC和PPM技术)[2]。介绍根据这些新技术开发的元器件内在质量评价系统的组成及其功能。该评价系统适用于各类元器件生产。元器件生产厂家应该尽快采用这些技术 ,以便与国际要求接轨 ,尽早将产品打入国际市场。

关 键 词:内在质量  可靠性  评价系统  工序能力指数  统计过程控制
修稿时间:2001-07-10

The EvaluatingSystem for the Building-in Quality of Electronic Parts at PPM Level
JIA Xin-zhang,LIU Ning,SONG Jun_jian. The EvaluatingSystem for the Building-in Quality of Electronic Parts at PPM Level[J]. Electronic Product Reliability and Environmental Testing, 2001, 0(5): 2-7
Authors:JIA Xin-zhang  LIU Ning  SONG Jun_jian
Abstract:In order to characterizing the higher and higher quality and reliability of the electronic parts, the new idea for evaluating the building-in quality of electronics parts was introduced, and three evaluating techniques, i.e. Cpk (Process capability ratio), SPC (Statistical Process Control),and PPM (Parts Per Million) were used during the past 10 years by many famous international companies. An evaluating system using these techniques is developed, and the components and function of the system are described. This evaluating system is suitable for the manufacturing of various kinds of electronic parts. The manufacturers should use these techniques as soon as possible in order to export their products to the international market.
Keywords:building-in quality  reliability  evaluating system  process capability ratio (Cpk)  statistical process control (SPC)
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