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Back-scatter electron images at 200 kV of subsurface structures in composite materials |
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| Authors: | J T Fourie |
| Abstract: | Back-scatter electron images of subsurface structures of higher atomic number than the matrix are obtained at accelerating voltages of 50, 100, 150 and 200 kV. Similar back-scatter images of structures on the bottom surface of single crystal foils of copper and mica ranging in thickness from 1 to 4 μm are compared with STEM images. It is concluded that at 200 kV a reasonable resolution of structures down to 1 μm subsurface is possible. |
| Keywords: | Back-scatter electrons subsurface images inelastic scattering copper-molybdenum composites aluminium-copper composites grating replica on copper grating replica on mica image-voltage dependence crystal apertures |