Microstructure and Dielectric Properties of YMnO3 Thin Films Prepared by Dip-Coating |
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| Authors: | Hiroya Kitahata Kiyoharu Tadanaga Tsutomu Minami Norifumi Fujimura Taichiro Ito |
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| Affiliation: | Department of Applied Materials Science, Osaka Prefecture University, Sakai, Osaka 599, Japan |
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| Abstract: | YMnO3 thin films with Y/Mn ratios from 1.00/1.05 to 1.00/0.90 were prepared by dip-coating from solution, in which starting materials were refluxed, and the effects of the Y/Mn ratio on the structure and dielectric properties of YMnO3 thin films were investigated. XRD measurements indicated that the films with the Y/Mn ratios in this study were a single phase of polycrystalline YMnO3. The lattice constants along the a -axis and c -axis lengthened with an increase in the Y/Mn ratio. FE-SEM micrographs of the films showed that the surface of the films became smoother and denser with an increase in the Y/Mn ratio. YMnO3 thin films with good dielectric properties were obtained with an Y/Mn ratio of 1.00/0.90, which gave the smoothest and densest microstructure and the smallest leakage current. |
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