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脉冲偏压对贫铀表面磁控溅射离子镀铝结合强度的影响
引用本文:王庆富,鲜晓斌,刘柯钊,刘清和. 脉冲偏压对贫铀表面磁控溅射离子镀铝结合强度的影响[J]. 原子能科学技术, 2007, 41(3): 268-272. DOI: 10.7538/yzk.2007.41.03.0268
作者姓名:王庆富  鲜晓斌  刘柯钊  刘清和
作者单位:中国工程物理研究院,四川 ;绵阳 621900
基金项目:中国物理研究院科研项目
摘    要:采用磁控溅射离子镀技术在不同偏压下于贫铀表面制备铝镀层,用扫描电镜和俄歇电子能谱仪对镀层形貌和界面元素分布进行分析,用拉伸法对镀层的结合强度进行测定。结果表明:在-900V脉冲偏压下所得镀层与铀基体结合良好,镀层与基体之间存在较为明显的“伪扩散区”;与直流偏压相比较,脉冲偏压所得镀层结合强度明显增强,镀层的致密性显著改善。

关 键 词:贫铀   铝镀层   脉冲偏压   结合强度
文章编号:1000-6931(2007)03-0268-05
收稿时间:2006-07-18
修稿时间:2006-07-182006-09-28

Effect of Pulse Bias Voltage on Adhesive Strength of Magnetron Sputtering Ion Plated Al Coating on Depleted Uranium Surface
WANG Qing-fu,XIAN Xiao-bin,LIU Ke-zhao,LIU Qing-he. Effect of Pulse Bias Voltage on Adhesive Strength of Magnetron Sputtering Ion Plated Al Coating on Depleted Uranium Surface[J]. Atomic Energy Science and Technology, 2007, 41(3): 268-272. DOI: 10.7538/yzk.2007.41.03.0268
Authors:WANG Qing-fu  XIAN Xiao-bin  LIU Ke-zhao  LIU Qing-he
Affiliation:China Academy of Engineering Physics, P.O.Box 919-71, Mianyang 621900, China
Abstract:Al coatings on depleted uranium surface were prepared with magnetron sputtering ion plating process at different pulse bias voltages.Surface and interfacial morphology of Al coatings were observed with scanning electron microscope.The distribution of element near interface between Al coating and uranium substrate was analyzed with Auger electron spectroscopy.The adhesive strength of Al coatings on uranium surface was measured with tensile method.Al coating prepared with pulse bias voltage at-900 V has better adhesive property to uranium substrate,and pseudo diffusion zone is relatively obvious at the interface between them.Compared with DC bias voltage,the coatings prepared with pulse bias voltage have enhanced adhesive strength and improved density.
Keywords:depleted uranium  Al coating  pulse bias voltage  adhesive strength
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