| Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties |
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| 引用本文： | WANG Zhongmin Chi Ying Vanessa Li ZHOU Huaiying Sammy Lap Ip Chan SHI Liu. Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties[J]. 稀有金属(英文版), 2006, 25(5): 543-548. DOI: 10.1016/S1001-0521(06)60096-X |
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| 作者姓名： | WANG Zhongmin Chi Ying Vanessa Li ZHOU Huaiying Sammy Lap Ip Chan SHI Liu |
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| 作者单位： | [1]Center of Material Science and Engineering, Guilin University of Electronic Technology, Guilin 541004, China [2]School of Materials Science and Engineering, University of New Sooth Wales, Sydney, NSW 2052, Australia [3]Institute of Metal Research, Chinese Academy of Sciences, China |
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| 基金项目： | The authors express their gratitude to Dr CHENG Jun and Dr CHENG Gang （both from Guilin Uni- versity of Electronic Technology, ER. China） for their help in XRD analysis and fruitful discussions. |
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| 摘 要： | AB5-based hydrogen storage thin fdms （LaNi4.25Al0.75）, deposited on Cu substrate by dc magnetron sputtering were investigated in this study. X-ray diffraction （XRD） revealed that the microstructure of the layer was in crystal form. SEM and AFM analyses proved that the film appeared to be rather rough with numerous randomly sized pores of approximately 15-40 in nm diameter. Structural stability of the film was examined by the combined analyses of DSC, XRD, and SEM, which indicated that this film maintained its structural stability below 500 K or so, and a network structure was observed on the film after being heated at 700 K for 30 min. Electrochemical hydrogen-storage properties of the films were investigated by simulated battery tests. It was found that single-layered LaNi4.25A10.75 film exhibited electrochemical hydrogen-storage properties similar to typical AB5 alloys in bulk, and the maximum discharge capacity of the film was about 220 mAh/g. After 20 charge/discharge cycles, small needle-shaped aluminium oxide was formed on some fractions of the film surface.
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| 关 键 词： | 储氢薄膜 磁控溅射 结构稳定性 电气化学性质 LaNi4.25Al0.75 |
| 收稿时间： | 2006-06-19 |
Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties |
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| WANG Zhongmin,Chi Ying Vanessa Li,ZHOU Huaiying,Sammy Lap Ip Chan,SHI Liu. Structural stability of single-layered LaNi4.25Al0.75 film and its electrochemical hydrogen-storage properties[J]. Rare Metals, 2006, 25(5): 543-548. DOI: 10.1016/S1001-0521(06)60096-X |
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| Authors: | WANG Zhongmin Chi Ying Vanessa Li ZHOU Huaiying Sammy Lap Ip Chan SHI Liu |
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| Affiliation: | 1. Division of Science Education, Chemistry Education Major, Daegu University, 201 Daegudae-ro, Gyeongsan-si, Gyeongsangbuk-do 712-714, South Korea;2. Department of Polymer Engineering, Graduate School, Chonnam National University, 77 Yongbong-ro, Gwangju 500-757, South Korea;3. Department of Chemistry, Graduate School, Daegu University, 201 Daegudae-ro, Gyeongsan-si, Gyeongsangbuk-do, South Korea |
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| Abstract: | AB5-based hydrogen storage thin films (LaNi4.25Al0.75), deposited on Cu substrate by dc magnetron sputtering were investigated in this study. X-ray diffraction (XRD) revealed that the microstructure of the layer was in crystal form. SEM and AFM analyses proved that the film appeared to be rather rough with numerous randomly sized pores of approxi- mately 15-40 in nm diameter. Structural stability of the film was examined by the combined analyses of DSC, XRD, and SEM, which indicated that this film maintained its structural stability below 500 K or so, and a network structure was ob- served on the film after being heated at 700 K for 30 min. Electrochemical hydrogen-storage properties of the films were investigated by simulated battery tests. It was found that single-layered LaNi4.25Al0.75 film exhibited electrochemical hydro- gen-storage properties similar to typical AB5 alloys in bulk, and the maximum discharge capacity of the film was about 220 mAh/g. After 20 charge/discharge cycles, small needle-shaped aluminium oxide was formed on some fractions of the film surface. |
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| Keywords: | hydrogen storage thin film magnetron sputtering structural stability electrochemical properties |
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