| RTD电路的可测试性设计 |
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| 引用本文： | 骆健,林弥,徐丽燕,王林,陈偕雄,金心宇. RTD电路的可测试性设计[J]. 浙江大学学报(工学版), 2004, 38(11): 1436-1440,1473 |
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| 作者姓名： | 骆健 林弥 徐丽燕 王林 陈偕雄 金心宇 |
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| 作者单位： | [1]浙江大学信息与电子工程学系，浙江杭州310027 [2]杭州电子科技大学电子信息学院，浙江杭州310018 |
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| 摘 要： | 针对共振隧穿二极管(RTD)电路由于具有超高集成度特点所带来的电路测试困难,在故障分析与故障模型的基础上提出了RTD电路的可测试性设计方案.该方案基于RTD电路开关级模型,针对电路基本的开路、短路故障合理增加控制端,利用控制端信号设计测试向量,使电路达到完全可测的目的.本方案可测试性程度较高,硬件花费较小,仅需附加一个金属氧化物半导体管(MOS)与两个控制端便可有效地测试出RTD电路的开路故障与短路故障,提高了电路的可控制性和可观察性,经PSPICE9.0软件验证达到了可测试性设计的目的.
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| 关 键 词： | 共振隧穿二极管(RTD) 短路故障 开路故障 可测试性设计 |
| 文章编号： | 1008-973X(2004)11-1436-05 |
Design of resonant tunneling diode circuits for testability |
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| LUO Jian,LIN Mi,XU Li-yan,WANG Lin,CHEN Xie-xiong,JIN Xin-yu. Design of resonant tunneling diode circuits for testability[J]. Journal of Zhejiang University(Engineering Science), 2004, 38(11): 1436-1440,1473 |
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| Authors: | LUO Jian LIN Mi XU Li-yan WANG Lin CHEN Xie-xiong JIN Xin-yu |
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| Affiliation: | LUO Jian~1,LIN Mi~2,XU Li-yan~2,WANG Lin~1,CHEN Xie-xiong~1,JIN Xin-yu~1 |
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| Abstract: | Because of the high integration characteristic of resonant tunneling diode (RTD) circuits, design for testability is significantly important to simplify the RTD circuits testing. The proposed design method of RTD circuits for testability was based on the fault analysis and faults model. Combining the switch-level model of RTD circuits and the basic principle of open faults and short faults, the control signals were added to generate the test benches by utilizing the control signals reasonably to achieve the full testability. The proposal has high testability and low hardware cost, which only adding one extra metal oxide semiconductor (MOS) transistor and two control ports, and enhances the controllability and observability of RTD circuits, and can detect all open and short faults in RTD circuits. The result of design for testability was validated by PSPICE9.0. |
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| Keywords: | resonant tunneling diode (RTD) short fault open fault design for testability |
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