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测定纳米晶粒尺寸分布的分峰法
引用本文:孙文华,魏铭鉴,秦麟卿. 测定纳米晶粒尺寸分布的分峰法[J]. 武汉理工大学学报, 1994, 0(2)
作者姓名:孙文华  魏铭鉴  秦麟卿
作者单位:Centre of Materiel Research and Analysis,WUT
摘    要:本文提出一种测定纳米晶粒尺寸分布的新方法-分峰法,其可靠性用规定超微粉颗粒大小分布的X-射线小角散射法(saxs)进行了验证,并用它成功地测定了SnO2薄膜和层状石墨的晶粒分布。

关 键 词:纳米晶粒;尺寸分布;分峰法

Peak Separation Method for Measuring Size Distribution of Nano-Crystallites
Sun Wenhua,Wei Mingjian,Qin Lingqing. Peak Separation Method for Measuring Size Distribution of Nano-Crystallites[J]. Journal of Wuhan University of Technology, 1994, 0(2)
Authors:Sun Wenhua  Wei Mingjian  Qin Lingqing
Abstract:The peak separation method for measuring size distribution of nano-crystallites has been proposed in this paper. Its reliability is proved by small angle X-ray scattering (SAXS) analysis that measures the size and size distribution of super-micro particles. Thus it is used to determine successfully the size distributron of SnO2 films and graphites.
Keywords:nano-crystallites  size distribution  peak separation method
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