| Mn1.56Co(0.96-x)Ni0.48CuxO4系列薄膜光电性质研究 |
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| 引用本文： | 张琰,黄志明,侯云,周炜,褚君浩.Mn1.56Co(0.96-x)Ni0.48CuxO4系列薄膜光电性质研究[J].红外与毫米波学报,2013,32(2):113-117. |
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| 作者姓名： | 张琰 黄志明 侯云 周炜 褚君浩 |
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| 作者单位： | 中国科学院上海技术物理研究所红外物理国家重点实验室,上海,200083 |
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| 基金项目： | 上海市优秀学科带头人计划（10XD1404800）；上海市自然科学基金（11ZR1442400） |
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| 摘 要： | 用化学溶液沉积法,以Al2O3为衬底在750℃温度下制备了锰钴镍铜Mn1.56 Co(0.96_x) Ni0.48 CuxO4系列薄膜.制备温度低于传统烧结工艺需要的温度(1100℃).采用X射线衍射(XRD)对所制备材料的结晶性能进行测量.结果表明,在一定范围内随着铜组分的增加,材料的择优取向发生变化,结晶性能提高且保持立方尖晶石单相结构.根据Scherrer方程和XRD数据计算薄膜的晶粒尺寸,Cu含量的增加导致薄膜晶粒尺寸增大.扫描电镜(SEM)图验证了制备的薄膜材料均匀致密,无裂痕.测量材料的变温I-V特性,计算材料在295 K下负温度电阻系数α及其活化能和特征温度,当Cu含量低时材料的α值较大,随着Cu组分的增加,α由-4.12％下降到-3.29％.利用椭偏光谱仪(SE),拟合材料在近紫外-可见-近红外波段的消光系数,并初步指认消光系数峰.
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| 关 键 词： | X射线衍射 扫描电镜 特征温度T0 活化能E 椭偏光谱 消光系数k |
| 收稿时间： | 4/13/2012 4:40:03 PM |
| 修稿时间： | 2012/11/2 0:00:00 |
Spectroscopic and electrial properties of manganese cobalt nickelate copper films prepared by chemical depopition |
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| ZHANG Yan,HUANG Zhi-Ming,Hou Yun,ZHOU Wei and CHU Jun-Hao.Spectroscopic and electrial properties of manganese cobalt nickelate copper films prepared by chemical depopition[J].Journal of Infrared and Millimeter Waves,2013,32(2):113-117. |
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| Authors: | ZHANG Yan HUANG Zhi-Ming Hou Yun ZHOU Wei and CHU Jun-Hao |
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| Affiliation: | National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences,National Laboratory for Infrared Physics,Shanghai Institute of Technical Physics,Chinese Academy of Sciences |
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| Abstract: | |
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| Keywords: | X-ray diffraction SEM characteristic temperature T0 activation energy E SE |
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