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Development of Reference Standards for the Calibration of Optical Systems Used in the Measurement of Microcomponents
Authors:G Pedrini  J Gaspar  W Osten  O Paul
Affiliation:Institut fuer Technische Optik, Univ. Stuttgart, Pfaffenwaldring 9, 70569 Stuttgart, Germany;
Department Microsystems Eng. –IMTEK, Univ. Freiburg, Georges-Koehler-Allee 103, 79110 Freiburg, Germany
Abstract:Abstract:  Optical techniques are well suited for the measurement of microcomponents but give accurate results only when calibrated systems are used. This paper presents the development of a standard reference device whose in-plane displacement is precisely reproducible when submitted to standard loadings. The reference device has been manufactured and tested by optical measuring systems. This reference device is to be used for the calibration of optical measuring systems in the future.
Keywords:calibration  displacement measurement  interferometry  MEMS
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