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Electro-thermal characterization of AlGaN/GaN HEMT on Silicon Microstrip Technology
Authors:M Riccio  A Pantellini  A Irace  G Breglio  A Nanni  C Lanzieri
Affiliation:1. University of Naples Federico II, Department of Biomedical, Electronic and Telecommunication Engineering, Via Claudio 21, 80125 Naples, Italy;2. SELEX Sistemi Integrati, Via Tiburtina km 12.400, 00131 Rome, Italy;1. Laboratory of Thermal Processes, Research and Technology Centre of Energy, Hammam Lif, Tunisia;2. University of Tunis El Manar, University Campus in Tunis, 2092, Manar II Tunis, Tunisia;3. Department of Energy Technology, Aalborg University, Aalborg, 9220, Denmark;4. Laboratory of Electronics and Microelectronics, University of Monastir, Monastir, 5019, Tunisia;5. Department of Physics, College of Science AlZulfi, Majmaah University, Al Majmaah 11952, Saudi Arabia;1. Department of Mechanical and Aerospace Engineering, University of Florida, Gainesville, FL 32611, USA;2. Department of Aerospace Engineering, Iowa State University, Ames, IA 50011, USA;3. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA;4. School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA 30332, USA;1. Department of Information Engineering, University of Parma, Viale G.P. Usberti, 181/a, 43124 Parma, Italy;2. INFN Pavia, via Agostino Bassi, 6, 27100 Pavia, Italy
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