Experimental power cycling on insulated TRIAC package: Reliability interpretation thanks to an innovative failure analysis flow |
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| Authors: | A Aubert S Jacques S Pétremont N Labat H Frémont |
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| Affiliation: | 1. Department of Earth, Atmospheric, and Planetary Sciences, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, US;2. Southwest Research Institute, Boulder, CO 80302, USA;3. National Aeronautics and Space Administration (NASA) Ames Research Center, Space Science Division, Moffett Field, CA 94035, USA;4. Lowell Observatory, Flagstaff, AZ 86001, USA;5. Johns Hopkins University Applied Physics Laboratory, Laurel, MD 20723, USA |
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| Abstract: | This paper presents the insulated TO-220AB TRIAC package aging when these devices are subjected to experimental power cycling test with various case temperature swings (ΔTcase). This study includes reliability tests set-up, results and failure analysis. An innovative failure analysis flow is proposed to identify the failure mechanism implied. This new failure analysis process flow is necessary due to the complex stack of these devices. Finally, thanks to the reliability tests and the complete failure analysis results, the thermal resistance (Rth) change is correlated to the physical defect modification. This whole study gives the first data collection that is required to propose a lifetime prediction model for insulated TO-220AB TRIAC package during power cycling accelerated aging tests. |
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