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Poststress RF‐drifts of dual‐band LC VCO in 0.18‐μm CMOS technology
Authors:Sanjeev Jain  Sheng‐Lyang Jang  Miin‐Horng Juang
Affiliation:Department of Electronic Engineering, National Taiwan University of Science and Technology, , Taipei, Taiwan
Abstract:This article studies the RF‐property of a dual‐band voltage‐controlled oscillator (VCO). The designed circuit consists of a dual‐resonance LC resonator and a Colpitts negative resistance cell. The dual‐resonance LC resonator comprises a series‐tuned LC resonator and a parallel resonant resonator. The proposed VCO has been implemented with the TSMC 0.18 μm 1P6M CMOS technology. The VCO can generate differential signals in the frequency range of 3.0–3.37 GHz and 6.95–7.40 GHz with core power consumption of 10.08 and 10.24 mW at the dc drain‐source bias VDD of 1.4 V, respectively. The die area of the dual‐band VCO is 0.485 × 0.800 mm2. The circuit was operated at VDD = 3 V for 8 h and significant drift in RF parameters was found. © 2013 Wiley Periodicals, Inc. Int J RF and Microwave CAE 24:243–248, 2014.
Keywords:CMOS  hot‐carrier  series‐tuned LC resonator  parallel resonant resonator  dual‐band voltage‐controlled oscillator
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