Poststress RF‐drifts of dual‐band LC VCO in 0.18‐μm CMOS technology |
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Authors: | Sanjeev Jain Sheng‐Lyang Jang Miin‐Horng Juang |
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Affiliation: | Department of Electronic Engineering, National Taiwan University of Science and Technology, , Taipei, Taiwan |
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Abstract: | This article studies the RF‐property of a dual‐band voltage‐controlled oscillator (VCO). The designed circuit consists of a dual‐resonance LC resonator and a Colpitts negative resistance cell. The dual‐resonance LC resonator comprises a series‐tuned LC resonator and a parallel resonant resonator. The proposed VCO has been implemented with the TSMC 0.18 μm 1P6M CMOS technology. The VCO can generate differential signals in the frequency range of 3.0–3.37 GHz and 6.95–7.40 GHz with core power consumption of 10.08 and 10.24 mW at the dc drain‐source bias VDD of 1.4 V, respectively. The die area of the dual‐band VCO is 0.485 × 0.800 mm2. The circuit was operated at VDD = 3 V for 8 h and significant drift in RF parameters was found. © 2013 Wiley Periodicals, Inc. Int J RF and Microwave CAE 24:243–248, 2014. |
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Keywords: | CMOS hot‐carrier series‐tuned LC resonator parallel resonant resonator dual‐band voltage‐controlled oscillator |
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