| 确定断裂表面晶体学取向的电子背散射衍射方法 |
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| 引用本文： | 谢季佳,上官丰收,武晓雷,洪友士. 确定断裂表面晶体学取向的电子背散射衍射方法[J]. 电子显微学报, 2005, 24(6): 547-550 |
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| 作者姓名： | 谢季佳 上官丰收 武晓雷 洪友士 |
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| 作者单位： | 中国科学院力学研究所非线性力学国家重点实验室,北京,100080 |
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| 摘 要： | 利用扫描电镜中带多自由度的样品台和电子背散射衍射系统（EBSD）研究了断口的晶体学定向方法。对于镍拉伸变形后的沿晶断裂表面，利用EBSD确定了晶粒与样品坐标之间的晶体学取向关系，通过样品台倾转获得断裂面与样品之间的几何对应关系，从而定出样品沿晶断裂面主要的晶体学位向是{100}。
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| 关 键 词： | 晶体定向 电子背散射衍射 断裂面 |
| 文章编号： | 1000-6281（2005）06-0547-04 |
| 收稿时间： | 2005-05-16 |
| 修稿时间： | 2005-05-162005-08-19 |
Method for determining crystal orientation of fracture facet using electron back-scattering diffraction |
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| XIE Ji-jia,SHANGGUAN Feng-shou,WU Xiao-lei,HONG You-shi. Method for determining crystal orientation of fracture facet using electron back-scattering diffraction[J]. Journal of Chinese Electron Microscopy Society, 2005, 24(6): 547-550 |
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| Authors: | XIE Ji-jia SHANGGUAN Feng-shou WU Xiao-lei HONG You-shi |
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| Affiliation: | State Key Laboratory of Nonlinear Mechanics, Institute of Mechanics Chinese Academy of Sciences, Beijing 100080, China |
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| Abstract: | A method was proposed to characterize the crystallographic orientation of fracture surface facets in a scanning electron microscope. Firstly, the orientation of grain abutted on the facet was measured relative to the reference axes in Ni sample after tensile testing using electron back-scattering diffraction analysis. Secondly, the inclination of the facet with respect to the same reference axes was determined by using double-tilting stage. Finally, the direction of fracture facet of Ni tension sample was obtained to be {100} . |
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| Keywords: | crystal orientation electron back-scatter diffraction(EBSD) fracture facet |
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