| 一种去嵌入射频测量技术 |
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| 引用本文： | 黄成,叶荣芳. 一种去嵌入射频测量技术[J]. 电路与系统学报, 2008, 13(2): 132-135 |
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| 作者姓名： | 黄成 叶荣芳 |
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| 作者单位： | 东南大学,电子工程系,江苏,南京,210096 |
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| 摘 要： | 去嵌入是一种射频微波精确测量技术。本文介绍了一种新型的去嵌入测量技术。该方法只需要一个对称的直通微带结构就能完成去嵌入。最后利用该方法对0603封装的电感进行了测量，并提取了精确测量后的电感模型。结果表明本去嵌入方法可以应用于射频PCB上器件模型的精确测量和模型提取。
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| 关 键 词： | 夹具测量 去嵌入 双端口网络 S参数 |
| 文章编号： | 1007-0249(2008)02-0132-03 |
| 修稿时间： | 2005-04-18 |
A de-embedding RF measurement technique |
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| HUANG Cheng,YE Rong-fang. A de-embedding RF measurement technique[J]. Journal of Circuits and Systems, 2008, 13(2): 132-135 |
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| Authors: | HUANG Cheng YE Rong-fang |
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| Abstract: | De-embedding is one of the precision RF and microwave measurements.A novel de-embedding technique is presented in this paper.This method is unique in that one single symmetric THRU de-embedding structure is required.A 0603 inductor is measured and the extrinsic model of this device is extracted using this method.The results indicate this new technique is useful in RF PCB devices measurement and modeling. |
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| Keywords: | fixture de-embedding two ports network S parameters |
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