|
|||||
|
|
Lattice and Grain‐Boundary Diffusion of Al in Tetragonal Yttria‐Stabilized Zirconia Polycrystalline Ceramics (3Y‐TZP) Analyzed Using SIMS |
|
| Authors: | Kazimierz Kowalski Katarzyna Obal Zbigniew Pedzich Krystyna Schneider Mieczyslaw Rekas |
| Affiliation: | 1. Faculty of Metals Engineering and Industrial Computer Science, AGH University of Science and Technology, , Krakow, Poland;2. Faculty of Materials Science and Ceramics, AGH University of Science and Technology, , Krakow, Poland;3. Faculty of Computer Science, Electronics and Telecommunications, AGH University of Science and Technology, , Krakow, Poland |
| Abstract: | Aluminum oxide was deposited on the surface of 3 mol% yttria‐stabilized tetragonal zirconia polycrystals (3Y‐TZP). The samples were annealed at temperatures from 1523 to 1773 K. Diffusion profiles of Al in the form of mean concentration vs. depth in B‐type kinetic region were investigated by secondary ion mass spectroscopy. The experimental results for the lattice diffusion (DB) and grain boundary diffusion (DGB) are as follows: |
| Keywords: | |