首页 | 本学科首页   官方微博 | 高级检索  
     

应用混合游程编码的SOC测试数据压缩方法
引用本文:方建平,郝跃,刘红侠,李康. 应用混合游程编码的SOC测试数据压缩方法[J]. 电子学报, 2005, 33(11): 1973-1977
作者姓名:方建平  郝跃  刘红侠  李康
作者单位:西安电子科技大学微电子学院宽禁带半导体材料与器件重点实验室,陕西西安 710071
基金项目:新材料领域项目,国家自然科学基金
摘    要:本文提出了一种有效的基于游程编码的测试数据压缩/解压缩的算法:混合游程编码,它具有压缩率高和相应解码电路硬件开销小的突出特点.另外,由于编码算法的压缩率和测试数据中不确定位的填充策略有很大的关系,所以为了进一步提高测试压缩编码效率,本文还提出一种不确定位的迭代排序填充算法.理论分析和对部分ISCAS 89 benchmark电路的实验结果证明了混合游程编码和迭代排序填充算法的有效性.

关 键 词:测试数据压缩  不确定位填充  system-on-a chip(SOC)测试  混合游程编码  
文章编号:0372-2112(2005)11-1973-05
收稿时间:2005-04-11
修稿时间:2005-04-112005-07-14

A Hybrid Run-Length Coding for Soc Test Data Compression
FANG Jian-ping,HAO Yue,LIU Hong-xia,LI Kang. A Hybrid Run-Length Coding for Soc Test Data Compression[J]. Acta Electronica Sinica, 2005, 33(11): 1973-1977
Authors:FANG Jian-ping  HAO Yue  LIU Hong-xia  LI Kang
Affiliation:Key lab of ministry of education for wide Band-Gap Semiconductor Materials and Devices School of Microelectronic,Xidian University,Xi'an,Shaanxi 710071,China
Abstract:This paper presents a compression and decompression scheme based on run-length codes for reducing the amount of test data.We refer to this hybrid run-length codes,it has the excellent advantages of high compression ratios,robust and low area overhead.Since the compression ratios strongly depend on the strategy of mapping which doesn't care in the original test set to zeros or ones,we also present an Iterative Sort Filling algorithm to find the best assignment method which minimizes the total size of the test data and achieves higher compression ratio.The theoretical analysis and the experimental results for ISCAS 89 benchmark circuits demonstrated the compression efficiency of the proposed hybrid run-length codes and Iterative Sort Filling algorithm.
Keywords:test data compression  don't care assignment  system-on-a-chip test  hybrid run-length codes
本文献已被 CNKI 维普 万方数据 等数据库收录!
点击此处可从《电子学报》浏览原始摘要信息
点击此处可从《电子学报》下载免费的PDF全文
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号