XA readout chip characteristics and CdZnTe spectral measurements |
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Authors: | Barbier LM Birsa F Odom J Barthelmy SD Gehrels N Krizmanic JF Palmer D Parsons AM Stahle CM Tueller J |
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Affiliation: | NASA Goddard Space Flight Center, Greenbelt, MD ; |
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Abstract: | The authors report on the performance of a CdZnTe (CZT) array readout by an XA (X-ray imaging chip produced at the AMS foundry) application specific readout chip (ASIC). The array was designed and fabricated at NASA/Goddard Space Flight Center (GSFC) as a prototype for the Burst Arc-Second Imaging and Spectroscopy gamma-ray instrument. The XA ASIC was obtained from Integrated Detector and Electronics (IDE), in Norway. Performance characteristics and spectral data for 241Am are presented both at room temperature and at -20°C. The measured noise (σ) was 2.5 keV at 60 keV at room temperature. This paper represents a progress report on work with the XA ASIC and CZT detectors. Work is continuing and in particular, larger arrays are planned for future NASA missions |
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