模拟电路故障诊断的新方法

本文所提出的线性模拟电路故障诊断的新方法是在应用特勒根定理的同时,采用多频率测试信号,使可测端口数m与所用不同频率的测试信号数f之积,大于同时发生的故障元件数k,即fm>k,就可决定故障元件的位置及其参数值。因为f是可以任意扩大的,所以本方法原则上可以诊断绝大多数模拟电路的多重故障。

A New Method of Fault Diagnosis in Analog Circuits

This paper proposed a new method of fault diagnosis in analog circuits. It was Tellegen's theorem as well as multifrequency measurements so that the multiplication of the number of the accessible ports mand the number of the multifrequences f is greater than the number of simultaneous fault elements k, i. e, fm>k. Thus we can determine the locations and the vatues of the fault elements. Because f can be arbitrary lorge, generally, the method can diagnose multiple faults of most of analog circuits.