A combined top and side entry specimen stage for a Hitachi H500 transmission electron microscope

The Hitachi H500 transmission electron microscope has been modified in order that both the top and side entry specimen stages may be fitted simultaneously. This made possible top entry multi-specimen operation up to a maximum magnification of × 100,000 and a resolution of 1.8 nm, combined with the normal side entry stage facilities of ±60° tilt, 0.45 nm resolution and × 400,000 magnification.