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Time structure measurement of the SSRF storage ring using TRXEOL method
Abstract:In order to do alignment between the timing signal and the synchrotron X-ray pulse on the sample spot in the time domain,measuring time structure of the storage ring on the sample spot inside the experimental hutch is a foundational step during the time-resolved experiments using the pulsed synchrotron X-rays with the time structure defined by the storage ring.In this work,the method of time-resolved X-ray excited optical luminescence(TRXEOL)was designed and implemented to do the measurement.It is based on the principle of time-correlated single photon counting techniques.The measurement system consists of a spectrometer with a detector of photomultiplier tube,a timing system,a set of nuclear instrument modules and a luminescent material of zinc oxide.The measurement was performed on the X-ray absorbed fine structure spectrum beamline at Shanghai Synchrotron Radiation Facility.The results show that this method can be used to measure the time structure of the storage ring with a precision of less than 1 ns.The measurement system can also be used for the time-resolved research for the optical luminescent materials.
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