Calibration of the operating parameters for an HB5 stem instrument |
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| Affiliation: | 1. Department of Production Engineering, Faculty of Mechanical Engineering, University of Technology and Life Sciences in Bydgoszcz;2. Department of Digital Technology, Faculty of Telecommunications and Electrical Engineering, University of Technology and Life Sciences in Bydgoszcz;3. Department of Microbiology and Molecular Genetics, University of Pittsburgh School of Medicine, Pittsburgh, Pennsylvania 15219 and;4. Department of Infectious Diseases and Microbiology, University of Pittsburgh Graduate School of Public Health, Pittsburgh, Pennsylvania 15261;1. Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium;2. Institute for Solid State Physics, University of Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany |
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| Abstract: | The interference fringes, or electron Ronchigrams, appearing in the shadow images of thin periodic objects may be used for calibration of the operating parameters of a scanning transmission electron microscopy (STEM) instrument. The determination of the spherical aberration constant is more simple and direct than by other means used in electron or light optics. The calibrated value for the spherical aberration may then be used in the determination of other primary aberrations. |
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