Observations on the growth of Al–Ni–Co decagonal thin films by atomic force microscopy and transmission electron microscopy |
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Authors: | Kaichi Saito Kazuya Ichioka Shigeo Sugawara |
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Affiliation: | Department of Materials Science and Engineering, Akita University, 1-1 Tegata-gakuen Chou, Akita 010-8502, Japan |
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Abstract: | Thin films of Al–Ni–Co alloy were produced by vacuum deposition technique using a substrate material of amorphous carbon thin-foil. Attempts were made to obtain a homogeneous decagonal quasicrystalline film, where the preparation technique was based on the direct evaporation of pre-alloyed ingot of Al72Ni15Co13 onto the heated substrates. In order to explore early stages of the decagonal film growth, the Al–Ni–Co films with different thicknesses ranging from 2 nm to 30 nm were deposited on either substrates heated at 500 °C or non-heated substrates. The film samples so obtained were examined mainly by atomic force microscopy in combination with transmission electron diffraction and imaging techniques. On the basis of these observations, deposition conditions necessary for the growth of decagonal phase in the resulting films as well as the growth mechanism of the decagonal film will be discussed. |
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Keywords: | Quasicrystals Thin films Vapor deposition Scanning and transmission electron microscopy X-ray diffraction |
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